The MultiView process visualization gives an overview about all parallel monitoring processes. It is easy to integrate additional function modules, for example for Dynamic Collision Detection (GEM AMS) or FFT Analysis (GEM VM). The modularity of the system is one of the characteristic features needed to adapt the monitoring system to dedicated systems and machines. GENIOR MODULAR is also capable of detecting the wear of a brushing tool and thus automatically adjusting the feed axis. A reduction of cycle time can be the result of this feed rate optimization. The option Adaptive Control adjusts the set feed rate of the cutting cycle, so that the effective force of the tool is as stable as possible. In addition to the described functions, data (BIG DATA) are collected and converted into information (SMART DATA) which can be stored locally or on network devices for further evaluations like analysis, trend curves, statistics and reports. Trend or alarm reports support the users to optimize processes and allow to produce much more efficiently. The system captures the measurement data digitally via fieldbus interface or via sensors and then evaluates the data based on multiple criteria and visualizes the processes in a transparent way. It reacts in real-time after an event occurs. The modular system makes use of all relevant process signals and data from machine tools. Semiconductors - Led & Consumer Electronics.
0 kommentar(er)
